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Vol 3 - Issue 1

Nanoelectronic Devices


List of Articles

Consideration on Impacts of Electric Field and Physical Confinement on Diffusion Constant and Carrier Lifetime in Insulated-Gate pn-Junction Devices

This paper discusses the impacts of electric field and physical confinement around the pn-junction on the diffusion constant and carrier lifetime of various pn-junction devices fabricated on silicon-on-insulator (SOI) substrates. The discussion will introduce the key points (...)


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2020

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Issue 1